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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 34-35
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- August 2022
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Transmission ion microscopy and time-of-flight spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1930-1932
- Print publication:
- August 2021
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npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1976-1977
- Print publication:
- August 2020
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Focused Ion Beams in Biology: How the Helium Ion Microscope and FIB/SEMs Help Reveal Nature's Tiniest Structures
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 864-865
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- August 2019
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Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 802-803
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- August 2018
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Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 618-619
- Print publication:
- July 2016
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