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Treating Knock-On Displacements in Fluctuation Electron Microscopy Experiments
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
- Published online by Cambridge University Press:
- 01 September 2022, pp. 2036-2046
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- December 2022
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Comparison of Experimental STEM Conditions for Fluctuation Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 6 / December 2020
- Published online by Cambridge University Press:
- 27 August 2020, pp. 1100-1109
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- December 2020
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Improving the Understanding of Ion-Beam-Induced Defect Formation and Evolution by Atomistic Computer Simulations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O2.1
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- 2000
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Computer Simulation of Channeling Profile Analysis of Implantation Damage
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- Journal:
- MRS Online Proceedings Library Archive / Volume 532 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 133
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- 1998
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Atomistic Modeling of the Ion Implantation Step Within a 2D Process Simulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 490 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 21
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- 1997
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Dynamic Simulation of Ultra-Shallow Implantation Profiles in Single-Crystalline Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 389 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 227
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- 1995
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Computer Simulation of Channeling Effects in Ion Implantation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 279 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 23
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- 1992
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