15 results
The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1414-1415
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- July 2017
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Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2209-2210
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- August 2015
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Atomic Scale Analysis of Chemical Intermixing in MBE-Grown GaSb/InAs Superlattices Based on Z-Contrast Imaging
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1988-1989
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- August 2013
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Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 710-711
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- August 2013
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Reduced Pressure - Chemical Vapor Deposition of Ge thick layers on Si(001) for microelectronics and optoelectronics purposes
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- MRS Online Proceedings Library Archive / Volume 809 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, B4.3
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- 2004
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Structural and Optical Properties of GaN Quantum Dots
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- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y4.7
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- 2003
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Movpe Growth and Characterization of AlxGa1-xN Layers on Sapphire
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- MRS Online Proceedings Library Archive / Volume 468 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 23
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- 1997
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Evidence of 2D-3D transition during the first stages of GaN growth on AlN
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 2 / 1997
- Published online by Cambridge University Press:
- 13 June 2014, e20
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- 1997
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Correlation between surface morphologies and crystallographic structures of GaN layers grown by MOCVD on sapphire
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 1 / 1996
- Published online by Cambridge University Press:
- 13 June 2014, e33
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- 1996
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Structural and Optical Properties of AlGaN/GaN Quantum-Well Structures Grown by MOCVD on Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 449 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 769
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- 1996
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Epitaxial growth of cubic GaN and AlN on Si(001)
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 1 / 1996
- Published online by Cambridge University Press:
- 13 June 2014, e21
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- 1996
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Understanding the Pyramidal Growth of GaN
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- MRS Online Proceedings Library Archive / Volume 395 / 1995
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- 21 February 2011, 393
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- 1995
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Microscopic Properties of Thin Films: Learning About Point Defects
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- MRS Bulletin / Volume 17 / Issue 12 / December 1992
- Published online by Cambridge University Press:
- 29 November 2013, pp. 24-32
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- December 1992
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Sol-To-Gel Transition in Reversed Micelles Microemulsions I. A New Route to Produce Monolithic Metal-Organic Derived Gels
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- MRS Online Proceedings Library Archive / Volume 121 / 1988
- Published online by Cambridge University Press:
- 25 February 2011, 115
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- 1988
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