9 results
Understanding MOCVD Gas Chemistry to Reduce the Cost of Ownership for GaN LED and AsP CPV Technologies
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1396 / 2012
- Published online by Cambridge University Press:
- 30 March 2012, mrsf11-1396-o01-06
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- 2012
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Electron Beam Bombardment Induced Decrease of Cathodoluminescence Intensity from GaN Not Caused by Absorption in Buildup of Carbon Contamination
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 9 / 2004
- Published online by Cambridge University Press:
- 13 June 2014, e8
- Print publication:
- 2004
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Reduction of Threading Dislocation Density in AlGaN by Indium Incorporation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y5.71
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- 2003
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X-Ray Diffraction Analysis of GaN and AlGaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 743 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, L6.12
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- 2002
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Optical Absorption of Nitrogen Vacancy in Proton Irradiated AlxGa1-xN thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I6.32.1
- Print publication:
- 2001
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The Influence of Contact Composition, Pretreatment, and Annealing Gas on the Ohmic Behavior of Ti/Al-Based Ohmic Contacts to n-Al0.4Ga0.6N
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- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E6.2
- Print publication:
- 2001
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Localized Vibrational Modes of Carbon-Hydrogen Complexes in MOCVD Grown GaN and AlGaN thin films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 639 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, G3.1
- Print publication:
- 2000
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Optical Characterization of SiC Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 201
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- 1999
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Spatial characterization of Doped Sic Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 512 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 297
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- 1998
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