24 results
Modulating the O-binding Energies of Mn-based Perovskites to Maximize Solar Thermochemical Hydrogen Production
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2350-2352
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- August 2022
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Correlative Electron Energy-Loss Spectroscopy Bandgap Mapping and DFT Modeling in AlGaN Diodes
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2010-2011
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- August 2022
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Using Xe Plasma FIB for High-Quality TEM Sample Preparation
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- Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
- Published online by Cambridge University Press:
- 15 March 2022, pp. 646-658
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- June 2022
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Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps
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- Microscopy Today / Volume 30 / Issue 2 / March 2022
- Published online by Cambridge University Press:
- 25 March 2022, pp. 24-29
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- March 2022
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Challenges and opportunities for data management and collaborative analysis in shared electron microscopy facilities
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1082-1083
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- August 2021
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TEM Sample Preparation of Buried Interfaces in Porous Layered Materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3466-3467
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- August 2021
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Measuring Electronic and Structural Transformations in Solar Thermochemical Water Splitting Materials with Aberration-Corrected STEM-EELS
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2428-2429
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- August 2021
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Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 218-219
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- August 2021
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Nanocrystalline Diamond Grids for FIB Specimen Preparation and S/TEM Analytics
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1018-1019
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- August 2021
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Three-dimensional Analysis of Materials at Multiple Length Scales
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1680-1682
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- August 2020
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Comparison of Orientation Mapping in SEM and TEM
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- Microscopy and Microanalysis / Volume 26 / Issue 4 / August 2020
- Published online by Cambridge University Press:
- 25 June 2020, pp. 630-640
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- August 2020
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Hardness Variation of Microstructural Heterogeneities in Directed Energy Deposited 304L Stainless Steel
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2602-2603
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- August 2019
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Contribution of Microstructural Features at Various Length Scales to the Strength of Additively Manufactured Austenitic Stainless Steels
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2574-2575
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- August 2019
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A Method for FIB Liftout of Particles in Epoxy Resin
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 910-911
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- August 2019
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Using EELS to Determine He Pressure Inside Nanometer-Scale Bubbles
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 438-439
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- August 2018
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A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 842-843
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- August 2018
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Crystallographic Orientation Image Mapping with Multiple Detector Configurations at 30 - 300 kV
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 534-535
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- July 2017
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Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 180-181
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- July 2016
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Using Energy-Filtered TEM to Solve Practical Materials Problems with Inspirations from Gareth Thomas
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1248-1249
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- July 2016
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Powder X-ray diffraction of Metastudtite, (UO2)O2(H2O)2
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- Powder Diffraction / Volume 31 / Issue 1 / March 2016
- Published online by Cambridge University Press:
- 17 February 2016, pp. 71-72
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