4 results
Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial Films
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue 5 / September 1997
- Published online by Cambridge University Press:
- 31 January 2003, pp. 436-442
- Print publication:
- September 1997
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Tem/Hrem Structural Characterization of Directionally Solidified Gaas-Cras Eutectic Crystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 398 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 151
- Print publication:
- 1995
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- Article
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Reducing Dislocation Density by Sequential Implantation of Ge and C in Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 139
- Print publication:
- 1993
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- Article
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Formation and Effects of Secondary Defects in Ion implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 2 / 1980
- Published online by Cambridge University Press:
- 15 February 2011, 209
- Print publication:
- 1980
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