Research Article
High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 393-408
-
- Article
- Export citation
In Situ Transmission Electron Microscopy Observations of Alloying of Nanoscale Pb Inclusions by Implantation with Cd Ions
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 409-416
-
- Article
- Export citation
Segregation of Bismuth to Triple Junctions in Copper
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 417-422
-
- Article
- Export citation
Structural Characterizations of Bi2Sr2CaCu2O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 423-435
-
- Article
- Export citation
Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial Films
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 436-442
-
- Article
- Export citation
Structure and Bonding at Ni–ZrO2 (Cubic) Interfaces Formed by the Reduction of a NiO–ZrO2 (Cubic) Composite
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 443-450
-
- Article
- Export citation
Analysis of Experimental Error in High Resolution Electron Micrographs
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 451-457
-
- Article
- Export citation
Other
News and Commentary
-
- Published online by Cambridge University Press:
- 31 January 2003, pp. 458-473
-
- Article
- Export citation