Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-23T10:59:02.375Z Has data issue: false hasContentIssue false
  • English
  • Français

Segregation of Bismuth to Triple Junctions in Copper

Published online by Cambridge University Press:  31 January 2003

K.-M. Yin ,
A.H. King ,
T.E. Hsieh ,
F.-R. Chen ,
J.J. Kai  and
L. Chang
K.-M. Yin
Affiliation:
Department of Nuclear Engineering and Engineering Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
A.H. King
Affiliation:
Department of Materials Science & Engineering, 314 Old Engineering, State University of New York at Stony Brook, Nicolls Road, Stony Brook, NY 11794-2275
T.E. Hsieh
Affiliation:
Department of Materials Science and Engineering, National Chiao Tong University, Hsinchu, Taiwan, Republic of China
F.-R. Chen
Affiliation:
Department of Nuclear Engineering and Engineering Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
J.J. Kai
Affiliation:
Department of Nuclear Engineering and Engineering Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
L. Chang
Affiliation:
Department of Materials Science and Engineering, National Chiao Tong University, Hsinchu, Taiwan, Republic of China
Get access

Abstract

Segregation of Bismuth to Triple Junctions in Copper

Type
Research Article
Information
Microscopy and Microanalysis , Volume 3 , Issue 5 , September 1997 , pp. 417 - 422
Copyright
2001 Cambridge University Press

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)