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RF Small and large signal characterization of a 3D integrated GaN/RF-SOI SPST switch
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 13 / Issue 6 / July 2021
- Published online by Cambridge University Press:
- 24 February 2021, pp. 517-522
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Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 10 / Issue 5-6 / June 2018
- Published online by Cambridge University Press:
- 28 August 2018, pp. 690-699
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