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EELS Analyses of Gaseous Atmosphere and Heated Specimen in an ETEM
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 506-507
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- August 2013
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Development of an in-situ High Temperature-High Humidity TEM Observation Technique and Its Application to the Analysis of Catalyst Degradation Mechanism
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1162-1163
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- July 2012
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Development of STEM for the HT7700 TEM and Optimization of Digital-Image Detectors Arrangement
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1280-1281
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- July 2012
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Growth and Evaluation of [AFeOx/REFeO3] (A=Ca, Sr, RE=La, Bi) Superlattices by Pulsed Laser Deposition Method Using High Density Targets Prepared by Pechini Method
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1454 / 2012
- Published online by Cambridge University Press:
- 12 July 2012, pp. 161-166
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- 2012
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Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 766-767
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- August 2006
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Surface and Interface Analysis of Thin-Film/Si(Substrate) Contacts by Sxes
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- MRS Online Proceedings Library Archive / Volume 448 / 1996
- Published online by Cambridge University Press:
- 03 September 2012, 377
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- 1996
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Nondestructive Study of Metal-Silicon Interfaces Using Soft X-Ray Emission Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 320 / 1993
- Published online by Cambridge University Press:
- 03 September 2012, 255
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- 1993
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Sxes Study of Transition Metal Silicide Films and their Contacts to Semiconductors
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- MRS Online Proceedings Library Archive / Volume 187 / 1990
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- 21 February 2011, 173
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- 1990
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Electron-Doped Superconductivity in CuO2 Layered Compounds with Nd2CuO4− structure
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- Journal:
- MRS Online Proceedings Library Archive / Volume 156 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 389
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- 1989
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Electronic and Structural Study of Ni(Co) Silicide/Si(111) Contact System Studied by Soft X-Ray Emission Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 159 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 173
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- 1989
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