Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-24T12:25:09.623Z Has data issue: false hasContentIssue false
  • English
  • Français

Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder

Published online by Cambridge University Press:  31 July 2006

T Kamino ,
T Yaguchi ,
A Watabe ,
H Saka  and
K Kishita
T Kamino
Affiliation:
Hitachi High-Technologies Corporation
T Yaguchi
Affiliation:
Hitachi High-Technologies Corporation
A Watabe
Affiliation:
Hitachi High-Technologies Corporation
H Saka
Affiliation:
Nagoya University
K Kishita
Affiliation:
Toyota Motors Corporation

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 766 - 767
Copyright
© 2006 Microscopy Society of America