6 results
Laser Ablation: A New Approach to APT Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 50-51
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- August 2022
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Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 16-17
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- July 2016
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Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1224-1225
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- August 2014
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In-Situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 342-343
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- August 2014
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Atomic Layer Deposition and Vapor Deposited SAMS in a CrossBeam FIB-SEM Platform: A Path To Advanced Materials Synthesis
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- Journal:
- Microscopy Today / Volume 17 / Issue 2 / March 2009
- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-25
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- March 2009
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Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis
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- Journal:
- Microscopy Today / Volume 16 / Issue 4 / July 2008
- Published online by Cambridge University Press:
- 14 March 2018, pp. 42-47
- Print publication:
- July 2008
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