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Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

Published online by Cambridge University Press:  14 March 2018

Brian P. Gorman ,
David Diercks ,
Norman Salmon ,
Eric Stach ,
Gonzalo Amador  and
Cheryl Hartfield
Brian P. Gorman*
Affiliation:
Dept. of Mat. Sci. and Eng. and Center for Advanced Research and Technology, University of North Texas, Denton, TX
David Diercks
Affiliation:
Dept. of Mat. Sci. and Eng. and Center for Advanced Research and Technology, University of North Texas, Denton, TX
Norman Salmon
Affiliation:
Hummingbird Scientific Instruments, Salem, OR
Eric Stach
Affiliation:
Hummingbird Scientific Instruments, Salem, OR
Gonzalo Amador
Affiliation:
Omniprobe, Inc., Dallas, TX
Cheryl Hartfield
Affiliation:
Omniprobe, Inc., Dallas, TX
*
Brian.Gorman@unt.edu

Extract

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Atom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.

Type
Research Article
Information
Microscopy Today , Volume 16 , Issue 4 , July 2008 , pp. 42 - 47
Copyright
Copyright © Microscopy Society of America 2008

References

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