Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 17
Thermally induced changes in optical and electrical properties of SnSb2S4 thin films
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- Published online by Cambridge University Press:
- 06 February 2008, pp. 91-95
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- Cited by 17
A nonlinear observer for induction motors
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- Published online by Cambridge University Press:
- 15 September 2001, pp. 181-188
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- Cited by 17
Effect of RF power on the structural and optical properties of RF-sputtered ZnO thin films
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- Published online by Cambridge University Press:
- 10 June 2014, 30302
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- Cited by 17
The influence of crystal imperfections on the shape of exciton emission spectrum in ZnO single crystals
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 305-307
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- Cited by 17
Topology of evolving pore networks
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- Published online by Cambridge University Press:
- 23 October 2012, 24202
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- Cited by 16
Assessment of mixing in passive microchannels with fractal surface patterning
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- 12 June 2009, 31301
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- Cited by 16
Gold and silver nanoparticles embedded in dielectric-capping layers studied by HAADF-STEM
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- 23 April 2008, pp. 3-9
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- Cited by 16
Luminescence in Ce3+ doped mixed sulphate fluoride phosphors [ NaMgSO4F and Na3SO4F]
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- 15 November 2006, pp. 73-78
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- Cited by 16
Exfoliation of Mo6SxI9-x nanowires in common solvents
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- 31 January 2007, pp. 149-159
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- Cited by 16
Testing of flexible InGaZnO-based thin-film transistors under mechanical strain
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- 11 August 2011, 23904
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- Cited by 16
A DFT study on the structural and electronic properties of ZnTe nanoclusters
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- 11 June 2013, 30101
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- Cited by 16
Vacuum annealing temperature on spray In2S3 layers
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- Published online by Cambridge University Press:
- 14 February 2014, 20304
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- Cited by 16
Contactless mapping of lifetime and diffusion length scan map of minority carriers in silicon wafers
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- 15 May 2000, pp. 157-162
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- Cited by 16
Determination of effective electron yield from swarm and time delay measurements
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- 15 June 2001, pp. 171-176
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- Cited by 16
Optical and electrical properties of Sn-Sb-Se chalcogenide thin films
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- 30 May 2008, pp. 23-30
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- Cited by 16
Effect of annealing and In content on the properties of electron beam evaporated ZnO films
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- 18 August 2005, pp. 95-99
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- Cited by 16
μ-Raman investigations of plasma hydrogenated silicon
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- Published online by Cambridge University Press:
- 25 February 2003, pp. 25-32
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- Cited by 16
Plasma nitriding of aluminium in a pulsed dc glow discharge of nitrogen
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- 26 January 2010, 21001
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- Cited by 16
Microwave conductivity measurements of high conductive polyaniline films
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- Published online by Cambridge University Press:
- 21 December 2004, pp. 65-72
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- Cited by 16
Interactive study of straight-sided buckling patterns in thin films under compressive stress
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- 15 April 2000, pp. 3-7
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