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Microwave conductivity measurements of high conductive polyaniline films

Published online by Cambridge University Press:  21 December 2004

H. Rmili ,
J.-L. Miane ,
H. Zangar  and
T. E. Olinga
H. Rmili
Affiliation:
Laboratoire de Physique des Interactions Ondes-Matières, UMR CNRS 5501, ENSCPB, 16 avenue Pey Berland, 33607 Pessac, France Département de Physique, Faculté des Sciences de Tunis, 2092 Tunis El Manar, Tunisia
J.-L. Miane*
Affiliation:
Laboratoire de Physique des Interactions Ondes-Matières, UMR CNRS 5501, ENSCPB, 16 avenue Pey Berland, 33607 Pessac, France
H. Zangar
Affiliation:
Département de Physique, Faculté des Sciences de Tunis, 2092 Tunis El Manar, Tunisia
T. E. Olinga
Affiliation:
PANIPLAST, Parc scientifique UNITEC 2, 351 cours de la libération, 33405 Talence, France
*
jl.miane@enscpb.fr
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Abstract

This paper presents several techniques for determining the complex conductivity of highly electrically conducting polymer films at microwave frequencies. The advantages and disadvantages of these techniques are discussed. Microwave measurements were investigated using resonant cavity, reflection/transmission and impedance surface techniques. The dc conductivity was measured using the four wires technique. Polyaniline (Pani/DEHEPSA) films of 120 $\mu $m thickness, have conductivity of (5000-6000 S/m) and permittivity of $6000 \pm 1000$ over X and S bands. The high values of the measured conductivity and its weak dependence on frequency at least up to 12 GHz, confirm the metallic character of Pani-films and their efficient use in micro-electronic technology such as microwave integrated circuits (MMIC) and microwave devices.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 29 , Issue 1 , January 2005 , pp. 65 - 72
Copyright
© EDP Sciences, 2005

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References

Angelopoulos, M., Shaw, J.M., Kaplan, R.D., Perreault, S., J. Vac. Sci. Technol. B 7, 1519 (1989) CrossRef
Microelectronics Packaging, edited by R.R. Tummala, E.J. Rymaszewski (Van Nostrand Reinhold, New York, 1989), and references therein
Clarke, T.C., Krounbi, M.T., Lee, V.Y., Steet, G.B., J. Chem. Soc. Commun. 8, 384 (1981) CrossRef
Gregory, R.V., Kimbrell, W.C., Kuhn, H.H., Synthetic Met. 28, 823 (1989) CrossRef
Berry, D.W., J. Electrochem. Soc. 132, 1022 (1985)
Mäkelä, T., Pienimaa, S., Taka, T., Jussila, S., Isotalo, H., Synthetic Met. 85, 823 (1997)
Angelopoulos, M., Ray, A., MacDiarmid, A.G., Epstein, A.J., Synthetic Met. 21, 21 (1987) CrossRef
A.G. MacDiarmid, J.C. Chiang, A.F. Richter, N.L.D. Somasiri, A.J. Epstein, in Conducting polymers, edited by L. Alcacer (Reidel, Dordrecht, 1985), pp. 105–120
Biju Kumar, S., Hohn, H., Joseph, R., Hajian, M., Ligthart, L.P., Mathew, K.T., J. Eur. Ceram. Soc. 21, 2677 (2001)
John, H., Biju Kumar, S., Mathew, K.T., Josph, R., J. Appl. Polym. Sci. 83, 2008 (2002) CrossRef
M. Sucher, J. Fox, Handbook of Microwave Measurement (New York Polytechnic, 1963), Vol. 2
Olmi, R., Bini, M., Ignesti, A., Riminesi, C., Meas. Sci. Technol. 11, 1623 (2000) CrossRef
Ligthart, L.P., IEEE Trans. Microwave Theory Tech. MTT 31, 249 (1983) CrossRef
Pitt, K., Free, C., Tian, Z., J. Mater. Sci. Mater. Electron. 10, 519 (1999) CrossRef
Ceremuga-Mazierska, J., Supercond. Sci. Technol. 5, 391 (1992) CrossRef
Jih-Hsin Liu, Yi- Chia Lin, J.-T. Lue, Chien-Jang Wu, Meas. Sci. Technol. 13, 1132 (2002)
Sheng, P., Philos. Mag. 65, 357 (1992) CrossRef
Zuppiroli, L., Bussac, M.N., Paschen, S., Chauvet, O., Forro, L., Phys. Rev. B 50, 5196 (1994) CrossRef
Ulanski, J., Kryszewski, M., Polish J. Chem. 69, 651 (1995)
Olinga, T.E., Fraysse, J., Travers, J.P., Dufresne, A., Pron, A., Macromolecules 33, 2107 (2000) CrossRef
Waltron, R.A., Perturbation theory of resonant cavities, Proc. IEEE 107C, 272 (1960)
Linhart, J.G., Templeton, I.M., Dunomiur, R., British J. Appl. Phys. 7, 36 (1956) CrossRef
Stuchly, M.A., Stuchly, S.S., IEEE Trans. Instrum. Meas. 29, 176 (1980) CrossRef
Marsland, T.P., Evans, S., IEEE Proc. 134, 341 (1975)
A.A. Abrikosov, Fundamental of the Theory of Metals (North-Holland, Amsterdam, 1988), Chap. 7
Coleman, L.B., Rev. Sci. Instrum. 46, 1125 (1975) CrossRef