Symposium B – Microscopic Identification of Electronic Defects in Semiconductors
Research Article
The Donor State of Vanadium in Indium Phosphide
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- 28 February 2011, 359
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A Photoluminescence Study of Cd Related Centers in InP
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- Published online by Cambridge University Press:
- 28 February 2011, 365
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Absolute Photoionization Cross Sections of the Acceptor State Level of Chromium in Indium Phosphide
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- 28 February 2011, 371
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High Resolution Transmission Electron Microscopy of Proton Implanted Gallium Arsenide
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- 28 February 2011, 377
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A Tentative Identification of Certain Deep Levels in GaAs and Related Compounds
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- 28 February 2011, 385
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Growth of (110) GaAs/GaAs by Molecular Beam Epitaxy
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- 28 February 2011, 391
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Defects in GaAs as Revealed by Chemical Etching
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- 28 February 2011, 397
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Charge Trapping by Deep Donors in Si-Doped AlxGa1-xAS
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- 28 February 2011, 403
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A Study of Co and Mn in ZnO Varistors
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- 28 February 2011, 409
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Dry—Processing Induced Isolation—Degradation in GaAs Integrated Circuits
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- 28 February 2011, 415
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Luminescence and Tem-Investigation of Laser Induced Defects in (AI,Ga)As Heterostructures
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- 28 February 2011, 419
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Optically Detected Magnetic Resonance of Copper Doped Gallium Phosphide
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- 28 February 2011, 425
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Role of Electron Microscopy in Semiconductor Electronic Defects Analysis
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- 28 February 2011, 433
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EBIC Spectroscopy - A New Approach to Microscale Characterization of Deep Levels in Semi-Insulating GaAs
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- 28 February 2011, 441
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Defect Scattering of Phonons in Phoiopcited GaAs
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- 28 February 2011, 447
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Excitation Spectroscopy on Silicon Using Color Center Lasers Study of the Thermally Induced P Line (0.767eV) Defect
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- 28 February 2011, 453
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Local Vibrational Mode Spectroscopy of Impurities in Semiconductors
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- 28 February 2011, 459
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The Effect of Hydrostatic Pressure on Defect Annealing in Semiconductors
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- 28 February 2011, 471
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Defects in CZ—Silicon Investigated by the Positron Annihilation Techniques
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- 28 February 2011, 477
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Acceptor and Donor Impurities in Semiconductors Studied by the PAC—Method
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- 28 February 2011, 481
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