Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Compressive Sensing, Machine Learning & Advanced Computation in Microscopy

Abstract

GENFIRE: A Generalized Fourier Iterative Reconstruction Algorithm for High-Resolution 3D Electron and X-ray Imaging

Auto-encoders for Noise Reduction in Scanning Transmission Electron Microscopy

Dragonfly SegmentationTrainer - A General and User-Friendly Machine Learning Image Segmentation Solution

A Particle Extraction Method with an Improved Auto-encoder in Neural Networks with the Aid of HOG Feature Analysis

Under-sampling and Image Reconstruction for Scanning Electron Microscopes

Segmentation and Contour Extraction in Biological Transmission Electron Microscope Images with ‘Bag-of-Features’ Method in Machine Learning

Deep Learning Segmentation for Epifluorescence Microscopy Images

Real-time Video Enhancement and Computer Vision for In-Vivo Microscopy

A Route to Integrating Dynamic 4D X-ray Computed Tomography and Machine Learning to Model Material Performance

Digital Super-Resolution in EELS

Adaptive Biharmonic In-Painting for Sparse Acquisition Using Variance Frames

High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing

Implementation of Sparse Image Acquisition in a Conventional Scanning Transmission Electron Microscope

In-Chamber Reel-to-Reel System for Random-Access Volume Electron Microscopy

The Usage of Modern Data Science in Segmentation and Classification: Machine Learning and Microscopy

Reliable Event Detection for Incomplete and Streaming (S)TEM Images

Quantifying Feature Uncertainty in Sub-sampled Low-dose (S)TEM Images

Big, Deep, and Smart Data in Microscopy

Abstract

Computational Methods for Large Scale Scanning Transmission Electron Microscopy (STEM) Experiments and Simulations

Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images

Less is More: Bigger Data from Compressive Measurements

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Compressive Sensing, Machine Learning & Advanced Computation in Microscopy

Abstract

Big, Deep, and Smart Data in Microscopy

Abstract