Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-20T14:50:48.687Z Has data issue: false hasContentIssue false
  • English
  • Français

Auto-encoders for Noise Reduction in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

James P. Buban  and
Si-Young Choi
James P. Buban
Affiliation:
Korea Institute of Materials Science, 797 Changwondaero, Seongusan-gu, Changwon, Gyeongnam, South Korea51508
Si-Young Choi
Affiliation:
Korea Institute of Materials Science, 797 Changwondaero, Seongusan-gu, Changwon, Gyeongnam, South Korea51508

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 130 - 131
Copyright
© Microscopy Society of America 2017 

References

[1] LeCun, Y, et al, Nature 521 2015). p. 436.Google Scholar
[2] Vincent, P, et al, Proceeding of the 25th International Conference on Machine Learning (2008) p.1096.Google Scholar
[3] Buban, J, et al, Journal of Electron Microscopy 59 2009). p. 103.Google Scholar