Microscopy and Microanalysis: Volume 27 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 27 - August 2021

Physical Sciences Symposia

Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science

Maximum thicknesses of EELS log ratio thickness measurement for several elements

Microscopic Characterization of Eco-friendly Lokta Paper

Tuning the electrodeposition texture of β-Sn coatings for enhanced corrosion resistance

Graphene oxide prepared by a room temperature oxidation using a green mechanochemical method.

TEM Study for the Identification of Phases in Al2024 Alloys Cold Rolled-30%ε

Dark-field TEM study of the microstructural behavior in AZ31B/MWCNTs composites produced by the sandwich technique

Estimating illumination coherence width from focused-probe intensity profiles

Characterizing the Back-Contact Interface of Poly-Crystalline Cd(Se)Te Devices with XEDS, EELS, and HRSTEM

Optimized Amplitude-Dividing Beam Splitter Gratings for 4D STEM Holography

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Symmetry Analysis in Metallic Glasses by Electron Nanodiffraction

Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples

Dose-efficient tcBF-STEM imaging with real-space information beyond the scan sampling limit

Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices

Unifying 3D electron diffraction and serial electron diffraction into a high-resolution, high-accuracy and high-throughput structural analysis technique

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Imaging and Ion-Beam Milling of Biological Specimens with the Helium-Ion Microscope

New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy

Characterization of selective layer and biomolecules fouling in polymeric membranes for microalgae filtration applications using 3D FIB/SEM

Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples

Comparison of segmentation algorithms for FIB/SEM tomography of porous polymers: Importance of image contrast for machine learning segmentation

Microscopy and Microanalysis for Real World Problem Solving

How Many Microscopies Does It Take to Get to the Root Cause of the Fail? Sample Prep, Imaging, and In-Situ Analysis for Integrated Circuit Failure Analysis at the 14nm Node

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 27 - August 2021

Physical Sciences Symposia

Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Microscopy and Microanalysis for Real World Problem Solving