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Characterizing the Back-Contact Interface of Poly-Crystalline Cd(Se)Te Devices with XEDS, EELS, and HRSTEM

Published online by Cambridge University Press:  30 July 2021

John Farrell ,
Alexandra Bothwell ,
Manoj Jamarkattel ,
Michael Heben ,
James Sites  and
Robert Klie
John Farrell
Affiliation:
UIC, United States
Alexandra Bothwell
Affiliation:
CSU, United States
Manoj Jamarkattel
Affiliation:
UToledo, United States
Michael Heben
Affiliation:
CSU, United States
James Sites
Affiliation:
CSU, United States
Robert Klie
Affiliation:
University of Illinois at Chicago, Chicago, Illinois, United States

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 742 - 744
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Shockley, W. and Queisser, H. J., “Detailed balance limit of efficiency of p-n junction solar cells,” J. Appl. Phys., vol. 32, no. 3, pp. 510–519, 1961.CrossRefGoogle Scholar
Davies, A. R. and Sites, J. R.. Effects of non-uniformity on rollover phenomena in CdS/CdTe solar cells. In 33rd IEEE Photovoltaic Specialists Conference, 2008.A. R. Davies and J. R. Sites. Effects of non-uniformity on rollover phenomena in CdS/CdTe solar cells. In 33rd IEEE Photovoltaic Specialists Conference, 2008.Google Scholar
This material is based upon work supported by the U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under the Solar Energy Technologies Office Award Number DE-EE0008974.Google Scholar