Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 16
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 16 - July 2010

Contents

Page 42 of 57

Physical Sciences Symposia

Nanoscale Characterization of Next- Generation Photovoltaic Devices and Materials

Abstract

  • The Role of Microanalysis in Micro/Nanowire-Based Future Generation Photovoltaic Devices

  • BA Wacaser, MC Reuter, MM Khayyat, R Haight, S Guha, FM Ross
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1368-1369
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Synthesis of Vertically-aligned ZnO/ZnS Core/shell Nanowire Array for Photovoltaic Application

  • K Wang, JJ Chen, ZM Zeng, J Tarr, WL Zhou, Y Zhang, YY Yan, A Mascarenhas
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1370-1371
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Nanoscale Characterisation of CuInGaSe2/CdS Structures Grown by Pulsed Electron Deposition

  • L Nasi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1372-1373
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ordering and Phase Transformation in Li1+x(Ni1/3Mn1/3Co1/3)1-xO2 Battery Electrode Material

  • KS Rao, N Pereira, G Amatucci, F Cosandey
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1374-1375
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • TEM Study on PbS Quantum Dots Made by Atomic Layer Deposition and Their Behavior Under E-beam Irradiation

  • HJ Jung, NP Dasgupta, FB Prinz, R Sinclair
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1376-1377
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • TEM Study of Stability of Inverted Photovoltaic (PV) Cells

  • YJ Suh, SY Park, TH Lee, WS Chung, KK Kim, MJ Kim
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1378-1379
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Low-Energy Scanning Electron Transmission Measurements of Thin Polymer Films Employed in Organic Solar Cells

  • M Pfaff, E Müller, MFG Klein, A Colsmann, U Lemmer, D Gerthsen
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1382-1383
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fabrication of Aligned Anatase TiO2 Submicron Spheres Using Porous Carbon

  • H Li, J Su, J Jiao
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1384-1385
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • A Study on the Modulation of the Electrical Transport by Mechanical Straining of Individual Titanium di Oxide Nanotube

  • A Asthana, T Shofuhkar, Q Gao, PA Heiden, C Friedrich, RS Yassar
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1386-1387
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Optical and Structural Characterization of a-Si Thin Film Solar Absorbers

  • G Atanasoff, A Mudgal, L-C Lai, W-A Chiou
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1388-1389
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High Resolution Electron Microscopy of CdSSe Nanowires

  • JK Walton, S Rouvimov, R Solanki
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1390-1391
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Dynamic SIMS Applications for Photovoltaic Technology Development

  • AN Davis, P Peres, A Merkulov, F Desse, S-Y Choi, M Schuhmacher
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1392-1393
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract

  • Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

  • AB Shah, JM Zuo, QM Ramasse, JG Wen, X Zhai, A. Bhattacharya, JN Eckstein
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1394-1395
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Transmission Electron Microscopy Study of Domain Structures in Multiferroic BiFeO3 Thin Films

  • CT Nelson, Y Zhang, CM Folkman, CB Eom, X Pan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1396-1397
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 2D Mapping of Bonding Changes at Peroskite Oxide Interfaces and Round Defects

  • L Fitting-Kourkoutis, JH Lee, JH Song, HY Hwang, DG Schlom, DA Muller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1400-1401
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • ZnO Epitaxy on (111) Silicon Using Intervening Bixbyite Oxide Buffer Layers

  • M Katz, W Guo, A Allenic, Y Chen, Y Zhang, CT Nelson, T Heeg, W Tian, C Adamo, D Schlom, X Pan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1402-1403
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Surface Kinetics of the Initial Oxidation Stages of Cu and Cu Alloys

  • JC Yang, Y Kang, L Luo, C Fleck, M Lee, A McGaughey, JA Eastman, G Zhou
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1406-1407
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 42 of 57