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Volume 16 - July 2010

Contents

Page 40 of 57

Physical Sciences

Nanostructured materials

Abstract

  • TEM Analysis of EuS/CdSe Nano Heterostructures

  • D Rossouw, T Mirkovic, GD Scholes, GA Botton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Grain Refinement, Stacking Faults and Mechanical Properties of Nanocrystalline Pd and Pd Alloys

  • C Kübel, L Kurmanaeva, A Castrup, T Scherer, J Ivanisenko
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ Investigation of Dielectric Breakdown in Field Effect Transistors

  • CS Bonifacio, AM Thron, G Bersuker, K van Benthem
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1298-1299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Instrumentation and Techniques

X-ray Spectrometry

Abstract

  • Alternative Windows for the Ultrahigh Collection Angle π sr Transmission X-ray Detector

  • NJ Zaluzec
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Applications Using an Annular Four-Channel Silicon Drift Detector

  • R Terborg, A Käppel, T Salge
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Improved Efficiency Characterisation for Large Solid Angle SDD Detectors

  • PJ Statham
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Excellent Performance with 100 mm² Silicon Drift Detectors

  • H Soltau, R Eckhardt, O Jaritschin, S Jeschke, P Lechner, A Liebel, G Lutz, A Niculae, G Schaller, F Schopper, A Simsek, L Strüder, O Zimmer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Compton Scattering in Electron Excited Energy Dispersive X-ray Spectra

  • N Ritchie, D Newbury, A Lindstrom
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Comparison of the Detection Limits of EDS and EELS in S/TEM

  • HS von Harrach, D Klenov, B Freitag, P Schlossmacher, PC Collins, HL Fraser
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result

  • S Scheller, T Salge, R Terborg
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Large Solid Angle 50 mm2 SDD for TEM Applications

  • S Barkan, VD Saveliev, NJ Zaluzec, CR Tull, L Feng, M Takahashi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1316-1317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Use of Scanning Electron Microscopy and Molecular/Atomic Spectroscopy to Characterize Beverage Flocculant

  • AD Lape, A Muroski, J Kruger, C McGuire, E Eliason, V St Jeor, D Elmore
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High Speed Accurate Quantification with X-Max Large Area Silicon Drift Detectors

  • S Burgess, C Collins, J Holland, N Rowlands
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1320-1321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Core Facility Management

Abstract

  • Practical Remote Microscopy Using KVM over IP

  • HO Colijn, DE Huber, PC Collins, HL Fraser
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1322-1323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • On-Line Tools for Management of Multi-user Microscopy Facilities

  • D-M Zheng, M Stevens-Kalceff, PR Munroe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Application of LEAN to a Global R&D Microscopy Organization in an Industrial Environment

  • O Guise
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 40 of 57