Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 1
Investigation of the Atomic and Electronic Structure of β-(Al0.2Ga0.8)2O3 Alloys by STEM-EELS
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 2186-2187
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Nanoimaging for Protein Misfolding Diseases. Critical Role of Misfolded Dimers in the Amyloid Self-Assembly
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 170-171
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STOPGAP_refine: Tilt series refinement for high-resolution subtomogram averaging
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- Published online by Cambridge University Press:
- 30 July 2021, p. 3240
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Simultaneous Z-Contrast/Phase Contrast Imaging of Ferroelectric Thin Films
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1464-1465
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Automatic Correction of Spectral Aberrations in EELS
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- 26 July 2009, pp. 212-213
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TEM/STM System for Study of Nanowires and Nanoparticles: How is it Important to Obtain 4D Information of Nanomaterials
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 1546-1547
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Reversible Phase Transformation in Y2O3 Under High Pressure
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- 26 July 2009, pp. 1006-1007
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Polarization Microscopy and Infrared Microspectroscopy of Integument Coverings of Diapausing Larvae in Two Distantly Related Nonsocial Bees
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- 27 February 2018, pp. 75-81
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Relationship between mechanical strain and chemical composition in LiFePO4 via 4D-scanning transmission electron microscopy and scanning transmission X-ray microscopy
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- 05 August 2019, pp. 2068-2069
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Atomic Scale EELS Study of the Origin of Ferromagnetism in Co doped ZnO Epitaxial Thin Films
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- 26 July 2009, pp. 436-437
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Domain Structure Control of BiFeO3 Films Through Substrate Symmetry and Film Thickness
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- 26 July 2009, pp. 1030-1031
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TEM Study of Oxygen Precipitation in Si Wafers with Backside Layers
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- 01 August 2005, pp. 2070-2071
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The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity
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- 06 August 2003, pp. 144-145
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Conical Diffraction Based Super-resolution System for Fluorescence Microscopy: System Description and Demonstration visualizing Biological Objects
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- 09 October 2013, pp. 1178-1179
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Parallel Beam Wavelength X-Ray Spectroscopy: An Evaluation of Current Performance
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- 01 August 2005, pp. 468-469
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Structural and Morphological Characterization of Novel Organic Electrochemical Transistors via Four-dimensional (4D) Scanning Transmission Electron Microscopy
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- 30 July 2021, pp. 1792-1794
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Imaging Fingerprints of an Ancient Egyptian Mummy by Propagation-Based Phase-Contrast X-Ray Tomography
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- 10 August 2018, pp. 364-365
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Application of Low Energy Broad Ion Beam Milling to Improve the Quality of FIB Prepared TEM Samples
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- 09 October 2013, pp. 1326-1327
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Single Crystal Elastic Constants of TWIP Steel Determined From Nanoindentation
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- 09 October 2013, pp. 1052-1053
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Thermo Scientific™ Tundra Cryo-TEM: 100kV Cryo-TEM dedicated for Single Particle Analysis
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- 30 July 2021, pp. 1330-1332
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