Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 1
Structural and Chemical Evolution of Li and Mn Rich Layered Oxide Cathode and Correlation with Capacity and Voltage Fading
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 141-142
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Increasing the Dimensionality of In-situ Electron Microscopy Data Sets by On-the-fly and Analytical Electron Tomography
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 724-725
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Random Spectrometer Motion for Removal of Time Dependent Artifacts in Spectroscopy
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- 09 October 2013, pp. 814-815
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Similarities and Differences in Kinetics and Dynamics During Li and Na Transport in MoS2Nanostructures
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- 25 July 2016, pp. 1386-1387
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Advanced EBSD Pattern Interpretation through Iterative Post-Processing
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 728-729
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Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 702-703
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Metallography of Robonaut 2 Battery Spot Welds
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 2427-2428
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A Combined Experimental and Theoretical Approach to Measure Spatially Resolved Local Surface Plasmon Resonances in Aluminum Nanocrystals
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- 01 August 2018, pp. 1682-1683
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Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Critical Dimension Metrology Tool
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1494-1495
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Understanding the Effects of Graphene Coating on the Electrostatic Field at the Tip of an Atom Probe Tomography Specimen
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- 30 July 2021, pp. 1054-1065
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Fabirication of Fine Electron Biprism Filament by Focused-Ion-Beam Chemical-Vapor-Deposition
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- 26 July 2009, pp. 316-317
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Quantifying Dispersion in Polymer Systems by Combining Image Analysis and Statistical Analysis
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- 08 April 2017, pp. 1472-1473
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Whole-Cell Tomography Using a Conventional Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 907-908
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Chemical Analysis with Single Atom Sensitivity Using Aberration-Corrected STEM
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- 27 August 2014, pp. 56-57
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Authors' Response
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- Published online by Cambridge University Press:
- 08 March 2005, pp. 113-115
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Use of Single Crystal Masks for Improved Mill Characteristics in High Current Xenon Plasma FIB instrumentation
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 152-153
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High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 1314-1315
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Nanoporous metal tips as frameworks for analysing frozen liquids with atom probe tomography
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- 30 July 2021, pp. 1512-1513
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Advantages of the Local Electrode for Atom Probe Tomography Applications.
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- 31 July 2006, pp. 1722-1723
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A Different Kind of Microscopy: Analyzing Features with an Automated Electron Beam
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- 31 July 2006, pp. 1782-1783
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