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Fabirication of Fine Electron Biprism Filament by Focused-Ion-Beam Chemical-Vapor-Deposition

Published online by Cambridge University Press:  26 July 2009

S Matsui ,
K-I Nakamatsu ,
K Yamamoto  and
T Hirayama
S Matsui
Affiliation:
University of Hyogo,Japan
K-I Nakamatsu
Affiliation:
University of Hyogo,Japan
K Yamamoto
Affiliation:
Japan Fine Ceramics Center,Japan
T Hirayama
Affiliation:
Japan Fine Ceramics Center,Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 316 - 317
Copyright
Copyright © Microscopy Society of America 2009