Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 1
High Throughput, High Quality Analysis in the Electron Microscope
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 1312-1313
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- Cited by 1
Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1084-1085
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Effect Mg Addition on Microstructure and Hardness of AI2024 Alloy after Thermo-Mechanical Treatments
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 1988-1989
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X-ray Mapping Is 50 Years Young; the Best Is Yet to Come; the Future Is Now!
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 818-819
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Isolating the Photocatalytic Degradation of Methylene Blue Dye on TiO2 Surface
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 281-282
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Contamination Removal Rates Improved by New Impedance Matching Network, for the Evactron® De-Contaminator
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 812-813
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New Molecular Tools for Light and Electron Microscopy
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 1-2
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The reaction interface between MgO and Al2O3
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 722-723
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Quantitative Characterization of Grain Structure and Orientation using Electron Back-Scattered Diffraction Patterns Collected by Serial Sectioning
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 1626-1627
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Smart EPU: SPA Getting Intelligent
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 454-455
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Electron probing of the oxygen evolving Ba0.5Sr0.5Co0.8Fe0.2O3-δ
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 2438-2439
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Strain measurement in FinFET structures with epitaxially grown SiGe on source/drain region by nano beam diffraction (NBD) method
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 732-733
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Focused Ion Beams of Xe+, Ar+, O+, and N+: Sputter Rate Trends, Chemical Interactions, and Emerging Applications
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 860-861
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Absolute Configuration, Optical Activity and Raman Microscopy of L and D-Glutamic Acid
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1382-1383
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Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 442-443
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Time Resolved SEM-SXES Analysis for Lithium Material
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 68-70
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Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1052-1053
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Understanding Microstructural Changes in Metals Induced by Gallium Ion Beam Irradiation
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 884-885
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Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 1656-1657
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Home- and Laboratory-based Microscopy of Face Covering Materials
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1292-1294
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