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Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

Published online by Cambridge University Press:  05 August 2019

Matthew Mecklenburg*
Affiliation:
Core Center of Excellence in Nano Imaging, University of Southern California, Los Angeles, USA.
William A. Hubbard
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, USA. California NanoSystems Institute, University of California, Los Angeles, USA.
Jared J. Lodico
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, USA. California NanoSystems Institute, University of California, Los Angeles, USA.
B. C. Regan
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, USA. California NanoSystems Institute, University of California, Los Angeles, USA.
*
*Corresponding author: matthew.mecklenburg@usc.edu

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hubbard, W A et al. , Physical Review Applied, 10 (2018), 044066.Google Scholar
[2]Zhu, Y et al. , Nature Materials, 8 (2009), p. 808812.Google Scholar
[3]Sternglass, E J, Physical Review, 108 (1957) p. 1.Google Scholar
[4]This work was supported by National Science Foundation (NSF) Science and Technology Center (STC) award DMR-1548924 (STROBE), and by NSF award DMR-1611036. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar