Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
USGS Microanalytical Reference Materials (MRMs) Development
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 492-493
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- Cited by 2
Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 388-389
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- Cited by 2
Evaluation of Lattice-Spacing of SiGe/Si by NBD using Two-condenser-lens TEM
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 2812-2813
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- Cited by 2
Measurement of Atom Resolvability in CryoEM Maps with Q-scores
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- 30 July 2020, p. 2316
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- Cited by 2
First-Surface Scintillator for Low Accelerating Voltage Scanning Electron Microscopy (SEM) Imaging
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- Published online by Cambridge University Press:
- 18 October 2018, pp. 488-496
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- Cited by 2
Ultrashort Pulsed Laser Induced Heat Affected Zones Characterized by Ion Channeling Contrast Imaging
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- 27 August 2014, pp. 1480-1481
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Quantitative Analysis of a Lithium Ion Battery Cathode Material with X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
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- 23 September 2015, pp. 1355-1356
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Synthesis and Characterization of Doped ZnO Photocatalysts
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- 01 August 2005, pp. 500-501
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Anchoring and Localizing Single Metal Atoms for Better Catalysis
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- 01 August 2018, pp. 20-21
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Morphological and Chemical Characterization of a Mechanically Alloyed Rubber Toughened PMMA With X-Ray Spectromicroscopy
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- 02 July 2020, pp. 142-143
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Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 512-513
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Hydrogen/Deuterium Charging Methods for the Investigation of Site-Specific Microstructural Features by Atom Probe Tomography
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- 22 July 2022, p. 1664
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Improving Sensitivity and Productivity with High count rate X-ray spectrum images
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- 04 August 2017, pp. 46-47
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In-Situ ETEM Reveals Formation Mechanism of Single Pt Atom on Ru Nanoparticle Electrocatalysts for CO-Resilient Methanol Oxidation
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- 22 July 2022, pp. 130-131
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Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra
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- 02 September 2022, pp. 1905-1916
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Design and Performance Characteristics of the ORNL Advanced Microscopy Laboratory and JEOL 2200FS-AC Aberration-Corrected STEM/TEM
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 2136-2137
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Direct Observation of Defects in Hexagonal Boron Nitride Monolayers
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- 27 August 2014, pp. 1738-1739
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Applications of Variable Pressure SEM and Raman Spectroscopy for the Non-destructive Study of Bio-Specimens from Pre-Columbian Mummies in the Tarapacá Valley, Northern Chile
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- 05 August 2007, pp. 1492-1493
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Focused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 358-359
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- Cited by 2
Mechanism of Si Field Evaporation
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 888-889
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