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Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

Published online by Cambridge University Press:  31 July 2006

U Schmidt ,
F Vargas ,
M Kress ,
K Weishaupt  and
O Hollricher
U Schmidt
Affiliation:
WITec GmbH,Germany
F Vargas
Affiliation:
WITec GmbH,Germany
M Kress
Affiliation:
WITec GmbH,Germany
K Weishaupt
Affiliation:
WITec GmbH,Germany
O Hollricher
Affiliation:
WITec GmbH,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 512 - 513
Copyright
© 2006 Microscopy Society of America