Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Microscopic Digital Imaging in Introductory Biology
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 456-457
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- Cited by 2
VSEM: From Technology Demonstrator Towards Integrated Educational Tool
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1566-1567
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- Cited by 2
The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 64-65
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- Cited by 2
Investigation of the Structure of Plasma Erosion Craters using a SEM/FIB Dual Beam Workstation
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- 07 September 2007, pp. 422-423
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- Cited by 2
Distinguishing Meteoritic Nanodiamonds from Amorphous Carbon Using Atom-probe Tomography
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- 04 August 2017, pp. 678-679
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- Cited by 2
Comparison of SiLi and SDD Detectors for Pharmaceutical Applications
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- 26 July 2009, pp. 382-383
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Theoretical Evaluation of Atomic-Resolution X-ray Analysis toward Quantification
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- 23 September 2015, pp. 1081-1082
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On the Evolution of Friction-Induced Microstructures in Single Crystal Nickel
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- 03 August 2008, pp. 906-907
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Single Electron Interferometry: A Step Toward Quantum Electron Microscopy
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- 05 August 2019, pp. 1712-1713
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X-ray Mapping Characterisation of Materials that have a Large Dynamic Compositional Range
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- 25 July 2016, pp. 114-115
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Early state of spruce somatic embryos in native state observed using the ESEM and Cryo-SEM
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- 09 October 2013, pp. 20-21
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Modifications to Membrane Heater Holders to Enable XEDS in the AEM
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- 23 September 2015, pp. 961-962
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- Cited by 2
Low Voltage Soft X-ray Emission Analysis from 100V for Depth Chemical Information from a few nm to several hundred nm
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- 25 July 2016, pp. 422-423
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Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope
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- 03 August 2008, pp. 1210-1211
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Application of Monochromated Electrons in EELS
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- 03 August 2008, pp. 134-135
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Solute Trapped at Defects during the Displacive Formation of Bainitic Ferrite
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- 05 August 2007, pp. 1640-1641
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In-Situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in Aberration-Corrected TEM/STEM
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- 26 July 2009, pp. 688-689
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Quantitative X-ray Images Calculated on the Basis of Mass and Volume
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- 31 January 2003, pp. 512-519
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Microstructural and Material Properties of Individual Zirconium Hydride Domains Formed Under Simulated Conditions
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- 01 August 2018, pp. 1054-1055
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Multiple Technique Characterization of a Nanostructured Ferritic Alloy: Heat-to-Heat, Long Term High Temperature Thermal Aging and Friction Stir Welding Effects on Nano-Scale Dispersion Strengthening Features
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- 01 August 2010, pp. 1600-1601
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