Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Nanocrystalline Diamond in Ru-DOPED DLC Films
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- Published online by Cambridge University Press:
- 01 November 2002, pp. 1146-1147
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- Cited by 2
Development of C/SiN Hybrid Sealing-Film for Environmental-Cell Window
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 534-535
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- Cited by 2
Characterization of the Fabrication Steps of a CNTs-Al Nanocomposite
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- Published online by Cambridge University Press:
- 05 August 2007, pp. 688-689
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- Cited by 2
Depth-related Contrast in Aberration-Corrected Confocal STEM
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 1574-1575
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- Cited by 2
Stainless Steel 304 Micro-pillar Mechanical Response to Ion Irradiation and Helium Implantation Under Transmission Electron Microscopy Observation
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 878-881
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- Cited by 2
Low angle ADF STEM defect imaging
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 676-677
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- Cited by 2
Use of Multilayer Correction Procedures to Improve the Quantitative Electron Microprobe Analyses of Coated Insulating Specimens
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 514-515
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- Cited by 2
Seeing the Atoms more Clearly: STEM Imaging from the Crewe Era to Today
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- 08 April 2017, pp. 1252-1253
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- Cited by 2
Automated Acquisition of Cryo Electron Micrographs Using Leginon
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 376-377
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- Cited by 2
Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 280-281
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- Cited by 2
Atomic Resolution at 50 - 300 kV Obtained using Low Dose Rate HRTEM
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- 08 April 2017, pp. 1266-1267
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- Cited by 2
Electric Field-Induced Surface Melting of Gold Observed In Situ at Room Temperature and at Atomic Resolution Using TEM
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 1830-1831
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- Cited by 2
3D Structure Studies of the Pancreatic Beta Cell by High Resolution Cellular Tomography
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- Published online by Cambridge University Press:
- 16 July 2003, pp. 1156-1157
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Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part II: Effect on Image Restoration Quality
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- Published online by Cambridge University Press:
- 30 August 2019, pp. 1183-1194
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- Cited by 2
Characterization of Sputtered Ge-Sn Thin Films by High Resolution Methods
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 712-713
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- Cited by 2
Using Electron-Probe Microanalysis and Quantitative Compositional Mapping to Study Lithic Clasts in Lunar Meteorites NWA 2727 and NWA 3170
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 714-715
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- Cited by 2
Advancements in Decontamination of Vacuum Systems Using Plasma Cleaning
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1130-1131
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- Cited by 2
Electron Tomography of HEK293T Cells Using Scanning Electron Microscope–Based Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 02 October 2012, pp. 1037-1042
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Scanning Electron Microscope (SEM) Coupled with Energy Dispersive X-ray Spectroscopy (EDS) - A Potential Analytical Tool for Physico-chemical Characterization of API in Complex Drug Formulations
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 2254-2255
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- Cited by 2
Mimetite Formation from Goethite-Adsorbed Ions
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- Published online by Cambridge University Press:
- 22 June 2016, pp. 698-705
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