Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Association between Chromatin Structural Organization of Peripheral Blood Neutrophils and Self-Perceived Mental Stress: Gray-Level Co-occurrence Matrix Analysis
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- Published online by Cambridge University Press:
- 02 August 2021, pp. 1202-1208
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- Cited by 2
SEM Study of the Photocatalytic Activity of SnO2 Films Exposed to UV Radiation Against the Human Pathogen C. albicans
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 1362-1365
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- Cited by 2
Imaging the Tissue Response Around Brain-Implanted Microdevices
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 146-147
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- Cited by 2
SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1026-1027
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- Cited by 2
Joy of Scanning with Electron and X-ray Imaging
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 624-625
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- Cited by 2
Advances in Auger Electron Spectroscopy and its Applications in the Field of Nanotechnology
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 354-355
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- Cited by 2
Calibrated Procedure for Setting Pulse-Height Parameters in Wavelength-Dispersive Spectrometry
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 420-421
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Chemical Quantification of Atomic-scale EDS Maps under Thin Specimen Conditions
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- 09 October 2013, pp. 1298-1299
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- Cited by 2
Microstructural Characterization of WC-Co Cemented Carbide Processed Using Selective Laser Sintering
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- 05 August 2019, pp. 2604-2605
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Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales
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- 05 August 2019, pp. 688-689
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Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM and APT
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 43-44
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- Cited by 2
Under-sampling and Image Reconstruction for Scanning Electron Microscopes
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 136-137
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- Cited by 2
Advertiser's Index
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- Published online by Cambridge University Press:
- 12 August 2003, p. 160
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- Cited by 2
CASINO Monte Carlo simulations of Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 258-259
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- Cited by 2
HHMI Tecnai F30 Helium Microscope: Initial Results and Observations
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- Published online by Cambridge University Press:
- 22 February 2017, pp. 854-855
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- Cited by 2
Investigating the Firing Protocol of Athenian Pottery Production: A Raman and Hi-Resolution TEM Study
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- 27 August 2014, pp. 2038-2039
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Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 192-193
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- Cited by 2
SEM Real-time Image Processing Using a GPGPU Approach
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 792-793
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Detection of Crystalline Components in Amorphous Solid Dispersions by Correlative Imaging Techniques
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- 25 July 2016, pp. 1070-1071
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- Cited by 2
Effect of High-Energy Ball Milling on the Microstructure of Natural Graphite
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 1598-1599
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