Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Every Child in the World Should Carry a Microscope in Their Pocket
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 2356-2357
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- Cited by 2
Impact of Energy-Dispersive Spectrometry in Materials Science Microanalysis
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- Published online by Cambridge University Press:
- 28 July 2005, pp. 567-575
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- Cited by 2
A Zebrafish Embryo Behaves both as a “Cortical Shell – Liquid Core” Structure and a Homogeneous Solid when Experiencing Mechanical Forces
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- Published online by Cambridge University Press:
- 26 September 2014, pp. 1841-1847
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- Cited by 2
Quantitative image analysis of white etching areas in SAE52100 bearing steel
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 459-460
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- Cited by 2
Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM
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- 02 July 2020, pp. 304-305
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- Cited by 2
Quantitative Convergent Beam Electron Diffraction for Simultaneous Structure Factor and Debye Waller Factor Determination - Fitting Method Optimization
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- 01 August 2010, pp. 938-939
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- Cited by 2
Atomic Structure and Bonding of Epitaxial CU Films on (1120) A-Al203
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- 02 July 2020, pp. 182-183
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Three-dimensional Analysis of Laser Scanning Confocal Microscope Sections Reveals an Array of Microtubules in the Cleavage Furrow of Sea Urchin Eggs
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- 02 February 2002, pp. 265-275
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- Cited by 2
Bitumen Recovery from Oil Sands Mature Fine Tailings
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- 01 August 2010, pp. 1226-1227
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- Cited by 2
Spatially Resolved Characterization of Phases in LiFePO4 Battery Cathodes Using Low Loss Electron Energy-loss Spectroscopy
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- 27 August 2014, pp. 432-433
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Electron Backscatter Diffraction Analysis of Single Pass Builds of Additively Manufactured Inconel 625
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- 01 August 2018, pp. 2216-2217
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- Cited by 2
Electron tomography at 2.4 Å resolution
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- 23 November 2012, pp. 522-523
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The 3d Parameters Of A (Nano)Crystal From Lattice Images At Two Tilts
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- 02 July 2020, pp. 188-189
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3D Microanalysis of Porous Copper Using FIB-Tomography in Combination with X-ray Computed Tomography
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- 04 August 2017, pp. 254-255
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Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials
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- 26 July 2009, pp. 332-333
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Auger Electron Spectroscopy (AES): A Versatile Microanalysis Technique in the Analyst's Toolbox
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- 30 July 2020, pp. 1564-1565
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Local Porosity Measurement From Scanning Electron Microscopy Images in the Backscattered Electrons Mode
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- 03 December 2020, pp. 20-27
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- Cited by 2
High Throughput Fabrication Process of a Zernike Phase Plate
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- 27 August 2014, pp. 222-223
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Defining Theoretical Limits of Aberration-Corrected Electron Tomography: New Bounds for Resolution, Object Size, and Dose
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- 05 August 2019, pp. 1810-1811
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Microwave Methods - Evidence to Support a Microwave Effect
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- 31 July 2006, pp. 296-297
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