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Electron Backscatter Diffraction Analysis of Single Pass Builds of Additively Manufactured Inconel 625

Published online by Cambridge University Press:  01 August 2018

N. D. Hart ,
B.W. Baker ,
T.T. Roehling  and
M.J. Matthews
N. D. Hart
Affiliation:
Mechanical Engineering Department, United States Naval Academy, Annapolis, MD, USA
B.W. Baker
Affiliation:
Mechanical Engineering Department, United States Naval Academy, Annapolis, MD, USA
T.T. Roehling
Affiliation:
Department of Mechanical Engineering, University of the Pacific, Stockton, CA, USA
M.J. Matthews
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2216 - 2217
Copyright
© Microscopy Society of America 2018 

References

References:

[1] King, W., Anderson, A., Ferencz, R., Hodge, N., Kamath, C., Khairallah, S. Rubenchik, A. Applied Physics Reviews 2015) vol. 2, p 041304.Google Scholar
[2] Roehling, T.T., Wu, S.S.Q., Khairallah, S.A., Roehling, J.D., Soezeri, S.S., Crumb, M.F. Matthews, M.J. Acta Mater 2017) vol. 128, pp 197–206.Google Scholar
[3] Boettinger, W.J. Mater. Sci. Eng 1988) vol. 98, pp 123–130.Google Scholar