Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 3
Quantitative Analysis of Microstructures by Secondary Ion Mass Spectrometry
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- Published online by Cambridge University Press:
- 14 July 2006, pp. 352-355
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- Cited by 3
TEM Evidence of Ordering Phenomena in YbSix (x≈1,4)
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- Published online by Cambridge University Press:
- 05 September 2003, pp. 340-341
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- Cited by 3
Estimating the Local Gas Pressure in a Gas Flow Cell Stage In Situ using Electron Energy Loss Spectroscopy
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 474-475
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Micromanipulation, FIB, STEM, EDS and EELS of UF4 Particles
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- 05 August 2019, pp. 1584-1585
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Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function
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- 09 April 2017, pp. 1308-1309
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New U-Th-Pb Isotope Reference Material for SIMS
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- 08 April 2017, pp. 836-837
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Automated Spectrum Imaging Using Hybridized DMScript and Python Code in DigitalMicrograph
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- 22 July 2022, pp. 2922-2923
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Primary Particle Size Distribution Measurement of Nanomaterials by Using TEM
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- 27 August 2014, pp. 1946-1947
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The Use of Scanning Electron Microscopy and Microanalysis to Classify Dentin
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- 06 August 2003, pp. 212-213
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Examining Protein Crystallization Using Scanning Electron Microscopy
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- 30 November 2012, pp. 145-149
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In situ/operando Study of Photoelectrochemistry Using Optical Liquid Cell Microscopy
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- 30 July 2020, pp. 2446-2447
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A Microstructural Study of the Al-Cr-Ru System
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- 02 July 2020, pp. 370-371
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Sharpening and Positioning of Regions of Interest in Atom Probe Samples using In-Situ Sputtering
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- 21 July 2003, pp. 578-579
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Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM
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- 01 August 2004, pp. 972-973
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Atomic-resolution Imaging Using Cs-corrected Vortex Beams
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- 27 August 2014, pp. 84-85
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Microscopic Characterization of the Thermal Evolution of Stainless Steel Coatings Sputter-deposited onto WC Particles
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- 03 October 2008, pp. 39-40
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In situ Imaging of Materials using X-ray Tomography
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- 01 August 2018, pp. 1002-1003
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Stability of Some Copper-based Dental Materials in Artificial Saliva
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 1632-1633
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Atomic Force Scanning Electrochemical Microscopy (AFM-SECM) for Electrochemical Imaging at the Nanoscale
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- 05 August 2007, pp. 58-59
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Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples
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- 05 August 2019, pp. 1718-1719
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