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Micromanipulation, FIB, STEM, EDS and EELS of UF4 Particles

Published online by Cambridge University Press:  05 August 2019

Lucille A. Giannuzzi ,
Michael DeVore II ,
Michael Summer  and
Matthew Wellons
Lucille A. Giannuzzi*
Affiliation:
L.A. Giannuzzi & Associates LLC, Fort Myers, FLUSA. EXpressLO LLC, Lehigh Acres, FLUSA.
Michael DeVore II
Affiliation:
Savanah River National Laboratory, Aiken, SCUSA.
Michael Summer
Affiliation:
Savanah River National Laboratory, Aiken, SCUSA.
Matthew Wellons
Affiliation:
Savanah River National Laboratory, Aiken, SCUSA.
*
*Corresponding author: Lucille.Giannuzzi@EXpressLO.com

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1584 - 1585
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Kips, R. et al. , Proc. Radiochim. Acta, 1 (2011) p. 7–11.Google Scholar
[2]DeVore, M. et al. , SRNL 2016 LDRD External Report, (2017), SRNL-MS-2017-00048 p. 101Google Scholar
[3]Darnbrough, J. et al. , J. of Nuc. Mat. Volume, 502 (2018) p. 9-19.Google Scholar
[4]Vitale, S. et al. , Microsc. Microanal., 22 (2016) p. 80.Google Scholar