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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 32
Quantifying Uncertainty from Mass-Peak Overlaps in Atom Probe Microscopy
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- Published online by Cambridge University Press:
- 14 February 2019, pp. 378-388
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- Cited by 32
In Situ Scanning Electron Microscope (SEM) Observations of Damage and Crack Growth of Shale
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- Published online by Cambridge University Press:
- 27 April 2018, pp. 107-115
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- Cited by 32
Electron Holography with a Cs-Corrected Transmission Electron Microscope
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- Published online by Cambridge University Press:
- 21 December 2007, pp. 68-81
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- Cited by 32
Automated Inclusion Microanalysis in Steel by Computer-Based Scanning Electron Microscopy: Accelerating Voltage, Backscattered Electron Image Quality, and Analysis Time
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- Published online by Cambridge University Press:
- 10 November 2017, pp. 1082-1090
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- Cited by 32
Portable Apparatus for In Situ X-Ray Diffraction and Fluorescence Analyses of Artworks
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- Published online by Cambridge University Press:
- 27 May 2011, pp. 667-673
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- Cited by 32
A Method for Quick, Low-Cost Automated Confluency Measurements
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- Published online by Cambridge University Press:
- 28 October 2011, pp. 915-922
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- Cited by 31
Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 454-455
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- Cited by 31
Errors, Artifacts, and Improvements in EBSD Processing and Mapping
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- Published online by Cambridge University Press:
- 28 January 2005, pp. 79-87
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- Cited by 31
Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study
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- Published online by Cambridge University Press:
- 27 October 2011, pp. 983-990
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- Cited by 31
Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography
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- Published online by Cambridge University Press:
- 18 March 2020, pp. 247-257
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- Cited by 31
Practical Aspects of Electrochemical Corrosion Measurements During In Situ Analytical Transmission Electron Microscopy (TEM) of Austenitic Stainless Steel in Aqueous Media
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- Published online by Cambridge University Press:
- 08 August 2017, pp. 741-750
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- Cited by 31
Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis
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- 12 February 2019, pp. 30-46
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- Cited by 31
Dictionary Indexing of Electron Channeling Patterns
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- Published online by Cambridge University Press:
- 06 February 2017, pp. 1-10
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- Cited by 31
Off-Axis Electron Holography of Unbiased and Reverse-Biased Focused Ion Beam Milled Si p-n Junctions
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- 28 January 2005, pp. 66-78
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- Cited by 30
Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy
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- Published online by Cambridge University Press:
- 07 March 2022, pp. 425-440
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- Cited by 30
In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays: High Resolution Imaging at Ambient Pressure and Elevated Temperature
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- 25 February 2016, pp. 178-188
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- Cited by 30
The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois
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- 26 February 2010, pp. 183-193
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- Cited by 30
A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments
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- 04 March 2013, pp. 470-478
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- Cited by 30
Feline HER2 Protein Expression Levels and Gene Status in Feline Mammary Carcinoma: Optimization of Immunohistochemistry (IHC) and In Situ Hybridization (ISH) Techniques
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- Published online by Cambridge University Press:
- 30 May 2013, pp. 876-882
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- Cited by 30
Measuring Thickness Changes in Thin Films Due to Chemical Reaction by Monitoring the Surface Roughness with In Situ Atomic Force Microscopy
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- Published online by Cambridge University Press:
- 27 November 2002, pp. 422-428
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