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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Scanning Electron Microscopy Coupled with Energy Dispersive Spectrometric Analysis Reveals for the First Time Weddellite and Sylvite Crystals on the Surface of Involucral Bracts and Petals of two Xeranthemum L. (Compositae) Species
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- 26 May 2017, pp. 679-686
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- Cited by 4
Staining And Other Microscopic Techniques For Textiles
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- 01 August 2002, pp. 192-193
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- Cited by 4
TEM Quantification of Amphibole in Asbestos Containing Materials: A Summary of Data 20 Years in the Making
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- 01 August 2018, pp. 1184-1185
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Microstructural Evaluation of Boron Free and Boron Containing Heat-Treated Ti-35Nb-7.2Zr-5.7Ta Alloy
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- 02 March 2012, pp. 295-303
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Systematics of Cathodoluminescence and Trace Element Compositional Zoning in Natural Quartz from Volcanic Rocks: Ti mapping in Quartz
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- 03 August 2008, pp. 38-39
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Photonic Iridescence of a Blue-Banded Bee
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- 01 August 2005, pp. 1202-1203
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Flight Readiness of Mochii S: Portable Spectroscopic Scanning Electron Microscope Facility on the International Space Station (ISS)
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- 05 August 2019, pp. 700-701
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Estimation of the Electron Beam Energy Spread for TEM Information Limit
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- 01 August 2002, pp. 480-481
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Cryo-FIB Lamella Milling: A Comprehensive Technique to Prepare Samples of Both Plunge- and High-pressure Frozen-hydrated Specimens for in situ Studies.
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- 01 August 2018, pp. 820-821
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Characterization of Defect Formation during Ni Silicidation for CMOS Device Application
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- 01 August 2005, pp. 2096-2097
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Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
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- 08 April 2017, pp. 752-753
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Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods
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- 01 August 2010, pp. 1860-1861
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Analysis Techniques of Lattice Fringe Images for Quantified Evaluation of Pyrocarbon by Chemical Vapor Infiltration
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- 22 July 2014, pp. 1591-1600
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Electrostatic Aberration Correction in LV-SEM
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- 02 July 2020, pp. 746-747
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Combined Confocal Raman Microscope with Scanning Electron Microscope; A Parallel Analysis of Inorganic and Organic Materials
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- 01 August 2002, pp. 1386-1387
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Al and Mg Kα Shifts in Common Silicate and Oxide Minerals: Relevance to Achieving the Goal of 1% Accuracy in EPMA
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- 31 July 2006, pp. 822-823
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Coherent Diffraction Imaging
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- 27 August 2014, pp. 368-369
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A Comparison of Raman and EDXRF Chemical Imaging for Use in Formulation Process Development and Quality Control
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- 01 August 2005, pp. 1246-1247
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Microstructural Analysis of 5XXX Series Aluminum Alloys for Optimal Strength and Corrosion Resistance
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- 01 August 2005, pp. 700-701
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Microstructural Characterization of Biofunctionalized Titanium Foams
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- 31 July 2015, pp. 55-56
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