Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Surface Coating Effect on Si Nanowires Anodes for Lithium Ion Batteries

EELS Investigations of Aging Mechanisms in LiFePO4 Cathodes Resulting From Prolonged Electrochemical Cycling

Contrasting Reaction Modality between Electrochemical Sodiation and Lithiation in NiO Conversion Electrode Materials

STEM-HAADF Imaging Study of Spinel Cubic Li4Ti5Oi2 Nanocrystals

Dynamic Observation of Tunnel-driven Lithiation Process in Single Crystalline a-MnCh Nanowires

EELS Analysis Of Lithiation/Delithiation Reactions In LiFePO4

Atomic Observation of Phase Transformation from Spinel to Rock Salt in Lithium Manganese Oxide

Microscopic Characterization of Electrodeposited Mg Layers for Battery Application

Analytical and Instrumentation Science Symposia

A01 Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

New Developments in Automated Particle Analysis in the Electron Microscope - from Micro to Nano

STEM-EDXS System for Atomic-Sensitivity Elemental Mapping

Aberration Correction System Using Segmented Detector in STEM

From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging

Imaging Contrast with Multiple Ion Beams

The Ultra-stable Scanning Transmission Electron Holography Microscope (STEHM)

A12 Low Voltage Electron Microscopy

Abstract

Opportunities for Low-Voltage TEM/STEM

Development of a Monochromated and Aberration-Corrected Low-Voltage (S)TEM

Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis

Strategies for high-resolution imaging of radiation-sensitive materials in an aberration-corrected transmission electron microscope

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

Investigation into Solute Stabilizing Effects in Nanocrystalline Materials: An Atom Probe Characterization Study

Precipitation in Highly Supersaturated Al-Sc-V, Al-Sc-Nb, and Al-Sc-Ta Alloys During Isochronal Aging

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Analytical and Instrumentation Science Symposia

A01 Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

A12 Low Voltage Electron Microscopy

Abstract

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract