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From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging

Published online by Cambridge University Press:  23 September 2015

Hua Guo
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Liang Jin
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Penghan Lu
Affiliation:
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Zhangjie Wang
Affiliation:
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Zhiwei Shan
Affiliation:
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Benjamin Bammes
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Michael Spilman
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Robert Bilhorn
Affiliation:
Direct Electron, LP, San Diego, CA, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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