Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy using μSTEM

Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy

Propagation of Bessel Beams along Atomic Columns in Crystal: a Bloch Wave and Multi-slice Analysis

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction

Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution

Certified Reference Material for Strain Measurement Using EBSD

Novel Applications of Electron Channeling Contrast Imaging

Advances in HREBSD for Elastic Strain Measurement and its Application to Mechanical Testing

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Valence-loss EELS Spectroscopy of Refractory Plasmonic Nanomaterials

Bandgaps and Surface Inter-Band States in Photocatalysts with High Energy Resolution EELS

Observation of Inter-Bandgap States in Doped Ceria via Monochromated EELS

Introduction to Plasmon Energy Expansion Thermometry

Nanoscopic imaging of energy transfer from single plasmonic particles to semiconductor substrates via STEM/EELS

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements

Dynamic Rate Mechanism of V2O5 Coated SnO2Nanowires for Lithium Ion Batteries Studied by in situ TEM

Elastic Properties of GaN Nanowires: Revealing the influence of planar defects on Young's modulus at nanoscale

Quantification of Electrochemical Nanoscale Processes in Lithium Batteries by Operando ec-(S)TEM

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Resolving the Atomic Structure of Materials Containing Light Elements by Annular-Bright-Field Electron Microscopy

Large-Collection-Angle BF STEM Imaging of Compound Semiconductors

Atomic Scale Structure and Bonding Configurations in Monocrystalline Ah-xBxPSb Alloys Grown Lattice Matched on Si(001) Platforms

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract