Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Developments of 4D-STEM Imaging - Enabling New Materials Applications

Examining the Relationship Between Local Polarization and Modulation Variations in a Relaxor Ferroelectric Tetragonal Tungsten Bronze By 4D STEM

Exploring the 3D Resolution of Parallax Phase Reconstruction from 4D STEM: A Dopant Depth Case Study

Momentum- and Energy-Resolved STEM at Atomic Resolution

Segmentation of “Important” Features in in High Dimensional Nanodiffraction Datasets

Assisting 4D-STEM Data Processing with Unsupervised Machine Learning

Utilising Unsupervised Machine Learning on Correlated EDS and 4DSTEM Data for Investigating the Structural Ordering Within Co2FeSi Thin Films

Exploring the Validity Limits of Direct Ptychographic Methods to Analyse 4D Scanning Transmission Electron Microscopy Datasets

100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM

Parallelizing py4DSTEM: 4D-STEM Analysis from Hours to Minutes

4D-STEM Characterization of Low q Scattering in Conductive Polymers Used for Li-ion Battery Anodes

Assisting Phase Unwrapping in Ptychography Through Minimal Phase Accumulation for Low Energy Electron Ptychography

Automated Grain Segmentation for Crystal Orientation mapping in 4D Scanning Transmission Electron Microscopy

Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data.

Finding Optimal Imaging Parameters for Measuring Long-Range Electric Fields with 4DSTEM by Utilizing STEM Multislice Simulations

In-Situ 4D-STEM Study of Amorphous Titanium Oxide for Water Splitting Application

Strain-Engineering of Aluminum Scandium Nitride Films Grown Directly on Silicon by Utilizing a Gradient Seed Layer: Application of 4D-STEM Technique

Towards Spatial Mapping of Atomic Vibration Amplitudes in Thermoelectric Materials: Quantitative Convergent Beam Electron Diffraction (QCBED) Study of BiCuOQ (Q = S, Se, Te)

Fluctuation Cepstral STEM for Imaging Disordered Materials

4D STEM with an Ultrafast Camera Reveals Mesoscale Structure in Anisotropic Molecular Glass Thin Films

A Quantitative Understanding of the Short Range Order in Disordered Rocksalt Cathode Materials

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Developments of 4D-STEM Imaging - Enabling New Materials Applications