Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices

Probing Changes in the Electronic Structure and Chemical Bonding of Ti3C2 MXene Sheets with Electron Energy-Loss Spectroscopy

Mapping pm-scale Lattice Distortions and Measuring Interlayer Separations in Stacked 2D Materials by Interferometric 4D-STEM

Probing Sources of Decoherence at Defects and Interfaces in Superconducting Quantum Materials and Devices

Uncovering the Role of Ordering in MoSi Superconducting Nanowire Single Photon Detectors with 4D STEM

Autonomous Detection and Identification of Defects in Nanoscale Devices using Electron Diffraction Imaging

Direct Measurement of Atomic Reconstruction, Strain, and Disorder in Moiré Materials using 4D-STEM

Extending Bragg Interferometry for the Study of Magic Angle Trilayer Graphene

Probing Three-dimensional Chiral Domain Walls in Polar Vortices

Multi-scale Visualization of Ferroelectric Domains in a Magnetically Frustrated TbInO3 Thin Film

In-situ Magnetic Domain Behavior in van der Waals Fe3GeTe2

Disentangling Exciton Linewidth Broadening Factors in Transition Metal Dichalcogenide Monolayer with Electron Energy Loss Spectroscopy

In-situ Lorentz Imaging of Room-Temperature Ferromagnetic Domains in Monolayer Vanadium-Doped WS2

Atomic Resolution STEM Imaging of Novel Van der Waals Materials Synthesized by Soft Chemical Methods

On Demand - Quantum Materials Under Electron Beam: From Atomic Structures To Working Devices

Mapping Valence Electron Distribution and Magnetic Field by 4D-STEM

Imaging Chemical Reactions using High Speed Electron Microscopy (EM)

Time-resolved Analytical Electron Microscopy with Single Nanosecond Electron Pulses

Harnessing High Temporal Resolutions to Explore Fluxional Behavior on CeO2 Nanoparticles under Reducing Conditions

Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning

Towards Microsecond Time-Resolved Cryo-Electron Microscopy

Room Temperature Decoking of Catalyst Nanoparticles Using Localized Surface Plasmon Resonance Energy

Advancements in UltraFast Electron Microscopy

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices

On Demand - Quantum Materials Under Electron Beam: From Atomic Structures To Working Devices

Imaging Chemical Reactions using High Speed Electron Microscopy (EM)