Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices

Micromagnetics Simulation as a Supplement to and Diagnostic for Lorentz Transmission Electron Microscopy

Detection Limits for Imaging Chiral Magnetic Materials with 4-Dimensional Lorentz Scanning Transmission Electron Microscopy

Methods for Multi-Layer van der Waals Heterostructures Topological Materials Discovery via STEM and LEEM

Reveal of Magnetic Domains and Tunable Supercell Structures in Two-dimensional Layered Oxide Thin Film via Differential Phase Contrast Imaging and Atomic-resolution STEM

Unravelling Temperature-Dependent Ordered Skyrmion Phases in Magnetic Layered Materials using Lorentz transmission Electron Microscopy

Room Temperature Néel-type Skyrmions in a van der Waals Ferromagnet Revealed by Lorentz 4D-STEM

Magnetic Signature in a Topological Kagome Magnet

Identifying Possible Two-Level-System Sources in Superconducting Qubit with Advanced Electron Microscopy

In-Situ EBIC STEM: Automated Quantification

Characterization and Growth of Quad Unit Cell Linear Defects in Potassium Tantalate

Nanoscale Engineering of Magnetic Textures in the Layered Magnet CrSBr Using Electrons and Helium Ions

Real Space Demonstration of Electric Current-Induced Isolated Skyrmion Deformation

Building Atomic and Plasmonic Devices via Electron Beams: from Desired Structures to Desired Properties

Exploring the Cryogenic Phase Changes within 2D MoTe2 via TEM, 4DSTEM and Electron Spectroscopy Techniques

Atomic-Scale Phase Transformation of CrCl3 Elucidated by Cryo-STEM

In-situ Imaging of Thermally Activated Atomic Reconstruction of Twisted Bilayer Transition Metal Dichalcogenides

Channeling-Induced Artifacts in Atom Tracking of Cations in Distorted Perovskites Imaged by HAADF-STEM

Imaging Charged Domain Walls in a 2D Ferroelectric

Universal Torsional Periodic Lattice Distortion in Twisted 2D Materials

Layer Stacking Determination in Topological Semimetal MoTe2 via STEM Imaging, Liquid He TEM, and Quantitative Electron Diffraction

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices