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Atomic Resolution STEM Imaging of Novel Van der Waals Materials Synthesized by Soft Chemical Methods

Published online by Cambridge University Press:  22 July 2022

Guangming Cheng  and
Nan Yao
Guangming Cheng*
Affiliation:
Princeton Institute of Materials, Princeton University, Princeton, NJ, USA
Nan Yao*
Affiliation:
Princeton Institute of Materials, Princeton University, Princeton, NJ, USA
*
Corresponding Author: gcheng2@princeton.edu and nyao@princeton.edu
Corresponding Author: gcheng2@princeton.edu and nyao@princeton.edu

Abstract

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Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1784 - 1785
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Copyright
Copyright © Microscopy Society of America 2022

References

Song, X et al. , Chemistry of Materials 33(20) (2021), p. 8070.10.1021/acs.chemmater.1c02620CrossRefGoogle Scholar
Singha, R et al. , Advanced Functional Materials (2021), p. 2108920.Google Scholar
Song, X et al. , Journal of the American Chemical Society 141 (2019), p. 15634-15640.10.1021/jacs.9b07503CrossRefGoogle Scholar
Cheng, GM et al. , Small 12 (2016), p. 818.10.1002/smll.201502440CrossRefGoogle ScholarPubMed
The authors acknowledge the use of Princeton's Imaging and Analysis Center (IAC), which is partially supported by the Princeton Center for Complex Materials (PCCM), a National Science Foundation (NSF) Materials Research Science and Engineering Center (MRSEC; DMR-2011750).Google Scholar