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Mapping pm-scale Lattice Distortions and Measuring Interlayer Separations in Stacked 2D Materials by Interferometric 4D-STEM

Published online by Cambridge University Press:  22 July 2022

Michael J. Zachman ,
Jacob Madsen ,
Xiang Zhang ,
Pulickel Ajayan ,
Toma Susi  and
Miaofang Chi
Michael J. Zachman*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Jacob Madsen
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria
Xiang Zhang
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, TX, USA
Pulickel Ajayan
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, TX, USA
Toma Susi
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria
Miaofang Chi
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
*
*Corresponding author: zachmanmj@ornl.gov

Abstract

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Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1752 - 1754
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Copyright
Copyright © Microscopy Society of America 2022

References

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Electron microscopy was conducted at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar