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Volume 11 - Issue S02 - August 2005

Contents

Page 45 of 54

Geology

Research Article

  • Observation of the Structure of Iridescent Surface Layer on Chalcopyrite

  • K Z Baba-Kishi, M K Lee, C W Tai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1770-1771
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • SEM Evidence of Acidithiobacillus Ferrooxidans (Af) Attachment to Sulfide Refractory Ore Surface

  • P de Lira, L Córdoba, E Orrantia, S G Flores, M A Makita
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1772-1773
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Epitaxial Bands and Electron Beam Damage in Natural Zircon Using Cathodoluminescence.

  • J L Mey, A Klaus
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1774-1775
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Microscopy Study on the Origin of Asterism in Almandine-Pyrope Garnets

  • M J F Guinel, M G Norton, D F Bahr
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1776-1777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 3D Reconstruction of Natural Soil Aggregates from the Tropics

  • G A Vrdoljak, R Zalpuri
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1778-1779
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Interfaces

Research Article

  • EBSD Analysis of Solid-State Reactions Between Al2O3 and Cu2O

  • J K Farrer, M M Nowell
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1780-1781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microstructural Studies of a Directionally Solidified Nb-27Mo-27Cr-9Al-9Si Alloy

  • Y L Hu, A L Vasiliev, L C Zhang, M Aindow, D M Shah
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1782-1783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Determination of Strain Relaxation at the Free Surfce of Strained-SiGe Film Using Convergent Beam Electron Diffraction

  • S-I Baik, Y-W Kim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1784-1785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microstructures of a Highly Conductive Nb:SrTiO3 Thin Film

  • Y L Zhu, X L Ma
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1786-1787
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • ADF-STEM Imaging of c-Si/a-Si Interfaces

  • Y Yan, Q Wang, M Page, T Wang, M M Al-Jassim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1788-1789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Kinetics of Agglomeration of Gibbsite Al(OH)3 Crystals in the Precipitation Stage of the Bayer Process

  • E Farias, D Del Ollo, J Gomez, B Hidalgo
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1790-1791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Control of Grain Boundaries in Orthorhombic Alpha-Uranium

  • D A Carpenter, J L Pugh, D F Teter
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1792-1793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Flattening of the Si-SiO2 Interface in Ultra-Thin SIMOX Structures

  • T Jutarosaga, S Seraphin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1794-1795
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Shifting Through Phase Fields: CaAl4O7 on Sapphire

  • A Altay, M A Gulgun, C B Carter
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1796-1797
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • An Interfacial Study of Borosilicate Glass and Fe-Ni-Co Alloy Joint

  • C Chanmuang, T Chairuangsri
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1798-1799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Magnetic and Superconducting Materials

Research Article

  • In-situ Lorentz TEM Observations in Ferromagnetic Shape Memory Alloys

  • S P Venkateswaran, N T Nuhfer, M De Graef
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1802-1803
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.

  • R Pantel, S Couderc, P Ancey, C Wyon, B Viala
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1804-1805
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media

  • J D Risner, T P Nolan, J Bentley, S Z Wu, S D Harkness IV, R Sinclair
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1806-1807
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Lorentz TEM Characterization of Al-Cu-Ge-Mn Alloys

  • J P Winer, N T Nuhfer, M E McHenry, M De Graef
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1808-1809
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 45 of 54