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High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media

Published online by Cambridge University Press:  01 August 2005

J D Risner ,
T P Nolan ,
J Bentley ,
S Z Wu ,
S D Harkness IV  and
R Sinclair
J D Risner
Affiliation:
Stanford University
T P Nolan
Affiliation:
Seagate Media Research Center
J Bentley
Affiliation:
Oak Ridge National Laboratory
S Z Wu
Affiliation:
Seagate Media Research Center
S D Harkness IV
Affiliation:
Seagate Media Research Center
R Sinclair
Affiliation:
Stanford University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1806 - 1807
Copyright
© 2005 Microscopy Society of America