Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Advances in Characterization of Geological and Extraterrestrial Samples

Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM

Chromium in Corundum: Ultra-high Contents Under Reducing Conditions

A Showcase of Analytical Techniques: Native V in Hibonite

Putting Stars in the Gap: in situ Irradiation and Heating of Synthetic SiC and Implications for the Origins of C-rich Circumstellar Materials

Coordinated Analyses of a Supernova Polycrystalline Olivine Aggregate in the CO Chondrite Dominion Range 08006

SEM-based Quantitative Analysis of Lunar Meteorite Northwest Africa 2727

New Frontiers in Atom Probe Tomography Applications

Correlative UHV-Cryo Transfer Suite: Connecting Atom Probe, SEM-FIB, Transmission Electron Microscopy via an Environmentally-Controlled Glovebox

Local Electrode Atom Probe Tomography of Carbon Fibre

New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals

Three-Dimensional Microstructural Characterization of Novel Chalcogenide Nanocomposites for Gradient Refractive Index Applications

Correlative Analysis in the Semiconductor Industry

APT Tip Shape Modifications During Analysis, Its Implications, and the Potential to Measure Tip Shapes in Real Time via Soft-X-Ray Ptychography

Hydride Growth Mechanism in Zircaloy-4: Investigation of the Partitioning of Alloying Elements

Understanding the Growth Mechanism of β-(AlxGa1−x)2O3 by Atom Probe Tomography

Multimodal Atomic Scale Characterization of Structural and Compositional Changes During Shear Deformation of Materials

Quantification of Solute Deuterium in Titanium Deuteride by Atom Probe Tomography with Both Laser Pulsing and High-Voltage Pulsing: Influence of the Global and Local Surface Electric Field

Application of Atom Probe Tomography to Complex Microstructures of Laser Additively Manufactured Samples

Combined APT, TEM and SAXS Characterisation of Nanometre-Scale Precipitates in Titanium Alloys

Nanoscale Spatially Resolved Mapping of Uranium Enrichment in Actinide-Bearing Materials

Atom Probe Tomography Analyses of Solute Segregation in Self-Ion Irradiated Electron-Beam Welded SA508 Grade 3 Reactor Pressure Vessel Steels

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Advances in Characterization of Geological and Extraterrestrial Samples

New Frontiers in Atom Probe Tomography Applications