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Volume 12 - Issue S02 - August 2006

Contents

Page 22 of 45

Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos

Abstract

  • Thin Film Quantification by EPMA: Accuracy of Analytical Procedure

  • C Merlet
  • Published online by Cambridge University Press:
    31 July 2006, pp. 842-843
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • New Measurements and Calculations of Inner-shell Ionization Cross Sections by Electron Impact

  • X Llovet, C Merlet, D Bote, JM Fernández-Varea, F Salvat
  • Published online by Cambridge University Press:
    31 July 2006, pp. 844-845
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Monte Carlo Simulation of EPMA Measurements on Complex Specimens Using PENELOPE

  • F Salvat, X Llovet
  • Published online by Cambridge University Press:
    31 July 2006, pp. 846-847
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • SIMS Analysis of Zircaloy Cladding and Ion Implanted UO2: First Results

  • CT Walker, S Brémier, S Portier
  • Published online by Cambridge University Press:
    31 July 2006, pp. 848-849
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Temperature-Dependence of Mg/Ca Deposition in Keratoisis sp.

  • CM MacRae, N Wilson, R Thresher, R Gurney
  • Published online by Cambridge University Press:
    31 July 2006, pp. 850-851
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • X-Ray Microanalysis of Porous Materials Using Monte Carlo Simulations

  • D Poirier, R Gauvin, RA L Drew
  • Published online by Cambridge University Press:
    31 July 2006, pp. 852-853
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Determination of the Backscattered Yield Coefficient by Monte Carlo Calculations and Comparison with Experimental Measurements

  • H Demers, R Gauvin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 854-855
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • SS_MC: A Monte Carlo Program For Modeling X-ray Generation

  • P Miller, J Sheffield-Parker
  • Published online by Cambridge University Press:
    31 July 2006, pp. 856-857
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Calculation of X-ray spectra for a Side Window Tube

  • M Procop, V-D Hodoroaba, A Bjeoumikhov
  • Published online by Cambridge University Press:
    31 July 2006, pp. 858-859
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • High Speed Particle Analysis with a Silicon Drift Detector

  • N Ritchie, D Newbury
  • Published online by Cambridge University Press:
    31 July 2006, pp. 860-861
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Low Energy X-Ray Detection with a Silicon Multi-Cathode Detector for Microanalysis

  • S Barkan, V Saveliev, C Tull, L Feng, M Takahashi, N Matsumori, D Newbury, J Small, J Iwanczyk
  • Published online by Cambridge University Press:
    31 July 2006, pp. 864-865
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Development of Wavelength-Dispersive X-ray Spectrometer for a Conventional Analytical Transmission Electron Microscope

  • T Masami, K Masao, F Kurio, K Jun
  • Published online by Cambridge University Press:
    31 July 2006, pp. 866-867
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparison of Monte Carlo Simulated k-ratios using WinX-Ray and WinCasino with Experimental Results

  • PT Pinard, R Gauvin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 868-869
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A New Material for the Performance Check of X-ray Spectrometers Attached to a SEM

  • M Procop, V-D Hodoroaba, M Griepentrog
  • Published online by Cambridge University Press:
    31 July 2006, pp. 870-871
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electron Probe Microanalysis of Li K-alpha with Newly Developed Ultra-Soft X-ray Spectrometer

  • S Fukushima, T Kimura, T Ogiwara, K Tsukamoto, T Tazawa, S Tanuma
  • Published online by Cambridge University Press:
    31 July 2006, pp. 872-873
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Determination of k-Factors Using the Extrapolation Technique

  • Q Jin, S Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 874-875
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Evaluation of Titanium Carbide Specimens for Microanalysis Reference Standards

  • R Marinenko
  • Published online by Cambridge University Press:
    31 July 2006, pp. 876-877
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Multi-Voltage EPMA of Thin Films or Nano Science in the Z Dimension

  • J Donovan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 878-879
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Core Community Specifications for Electron Microprobe Operating Systems: Software, Quality Control, and Data Management Issues

  • J Fournelle, P Carpenter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 880-881
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 22 of 45